Focused Ion Beam Microscope

EMA-ID FIB
Manufacturer Zeiss
Model XB 1540
Category Focused Ion Beam (FIB)
Location B.UG1.2.16
Lab phone 8233
Contact S. Irsen / F. Kreps / D. Rudolph

More Info:

  • Focused-Ion beam workstation
  • 1 - 20 kV electron beam (Schottky field emission gun)
  • 5 & 30 kV Ga-Ion beam 

Cameras & Detectors:

  • SE2 Detector 
  • InLens Detector
  • EDX Detector (Oxford)
  • EBSD camera (Oxford)
  • BSE Detector

Software:

  • SmartSEM 
  • INCA (EDX&EBSD imaging suite)
  • ELPHY nano/lithography

Applications: 

  • Automated FIB-tomography
  • Cross sectioning of sammples
  • FIB-lamella preparation
  • FIB-nanolithography
  • e-beam lithography
  • elemental mapping
  • grain analysis 

 

Extras:

  • ELPHY plus lithography system for Ion- & e-beam lithography
  • cryo stage and cryo-transfer system (Leica, VCT100) for cryo application
  • in-situ micromanipulator (Kleindiek) for room temperature and cryo application
  • plasma cleaner for cleaning the sample chamber

For further information please contact:

Dr. Stephan Irsen
Group Leader